Analytical Equipment
Analytical Equipment
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EDC Microscopy I
- Overview
A foundational EDC platform for non-contact conductivity analysis
- Feature
The world’s first non-contact conductivity distribution mapping
- Analysis
Nanoscale spatial resolution analysis
- Application
Suitable for low-conductivity and insulating materials
- Overview
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EDC Microscopy II
- Overview
A next-generation EDC platform integrated with SEM
- Feature
Enhanced resolution and quantitative analysis
- Analysis
Expanded analytical range
- Function
Advanced signal interpretation capabilities
- Overview
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FE-SEM
- Overview
A high-resolution electron microscope for structural analysis
- Feature
High-resolution morphology and structure analysis
- Analysis
Microstructure and defect analysis
- Integration
Correlation analysis between conductivity and structure
- Overview
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C-AFM
- Overview
Contact-based conductivity characterization equipment
- Feature
Precise measurement of local conductivity properties
- Analysis
Current flow and conduction path analysis
- Integration
Complementary and detailed analysis with EDC results
- Overview